Hall Probes for MG-4D/5D Gaussmeters

A wide selection of transverse and axial Hall probes is available to meet most applications. Accuracy of measurement is assured through the use of pre-calibrated probes which are calibrated in high accuracy fields standardized by nuclear magnetic resonance techniques which permit traceability to the National Institute of Standards and Technology (NIST). Probes are available with accuracies from ±0.1% to ±1.5% of reading. These probes are directly interchangeable and do not require special calibration. All probes are quickly self-calibrated to their instrument via a convenient front panel control.

The transverse Hall probe measures magnetic fields perpendicular to the axis of the probe. Standard probe thicknesses range from a thin-line version of .043" (1.09 mm) to a ruggedized version of 0.063" (1.60 mm). Ultra-thin probes are available on special order.

The axial Hall probe measures magnetic fields parallel to the axis of the probe such as solenoidal fields. Standard probe stem diameters are .263" (6.68mm) and are hou
sed in a rigid plastic stem for maximum protection for the most demanding industrial and laboratory applications.

This instrument is supplied with a 6-foot probe cable. However, additional cable length can be ordered as an option. Assistance is available to help in selecting the most suitable probe for your application
.

Specifications

Transverse

Mode HP

% Linearity of Reading

Temperature Coefficient %/°C

Temperature Range °C

Style

Stem Size (L x W x T) or (L x D)

Active Area
(L x W)

14S

±1% of 20 kG

-0.1

-55 to +100

V-1X

0.5"(12.70cm)x0.25"(6.35mm)x0.043"(1.09mm)

0.04”x0.08”
(1mmx2mm)

145S
145F
145R

±1% of 20 kG

-0.1

-55 to +100

I-1X
II-1X
I-1X

4"(10.16cm)x0.155"(3.94mm)x0.043"(1.09mm)
4"(10.16cm)x0.165"(4.19mm)x0.053"(1.35mm)
4"(10.16cm)x0.175"(4.45mm)x0.063"(1.60mm)

0.04”x0.08”
(1mmx2mm)

345S-(*)
345F-(*)
345R-(*)

±0.25% to 10 kG -(10)
±0.5% to 20 kG -(20)
±1% to 30 kG -(30)

-0.04

-40 to +100

I-10X
II-10X
I-10X

4"(10.16cm)x0.155"(3.94mm)x0.043"(1.09mm)
4"(10.16cm)x0.165"(4.19mm)x0.053"(1.35mm)
4"(10.16cm)x0.175"(4.45mm)x0.063"(1.60mm)

0.04” Dia.
(1mm)

645S
645F
645R

±0.1% to 30 kG

±0.005

-40 to +100

I-100X
II-100X
I-100X

4"(10.16cm)x0.155"(3.94mm)x0.043"(1.09mm)
4"(10.16cm)x0.165"(4.19mm)x0.053"(1.35mm)
4"(10.16cm)x0.175"(4.45mm)x0.063"(1.60mm)

0.040” Dia.
(1mm)

1145S
1145F
1145R

±1% to 30 kG /
±1.5% to 150 kG

±0.005

-40 to +100

I-100X
II-100X
I-100X

4"(10.16cm)x0.155"(3.94mm)x0.043"(1.09mm)
4"(10.16cm)x0.165"(4.19mm)x0.053"(1.35mm)
4"(10.16cm)x0.175"(4.45mm)x0.063"(1.60mm)

0.04” Dia.
(1mm)

Axial

24S

±1% to 30 kG

-0.1

-55 to +100

V-1X

0.5"(12.70cm)x0.25"(6.35mm)x0.043"(1.09mm)

0.04”x0.08”
(1mmx2mm)

245S
245F

±1% to 20 kG

-0.1

-55 to +100

III-1X
IV-1X

5.0" (12.70cm) x 0.263" (6.68mm)

0.04”x0.08”
(1mmx2mm)

845S-(*)
845F-(*)

±0.25% to 10 kG -(10)
±0.5% to 20 kG -(20)
±1% to 30 kG -(30)

-0.04

-40 to +100

III-10X
IV-10X

9.0" (22.86cm) x 0.263" (6.68mm)

0.04” Dia.
(1mm)

1045S
1045F

±0.25% to 30kG

±0.005

-40 to +100

III-100X
IV-100X

9.0" (22.86cm) x 0.263" (6.68mm)

0.02” Dia.
(0.5mm)

1245S
1245F

±1% to 30kG /
±1.5% to 150kG

±0.005

-40 to +100

III-100X
IV-100X

9.0" (22.86cm) x 0.263" (6.68mm)

0.02” Dia.
(0.5mm)

* - Specify

Model Number Suffix: F-Flexible, R-Ruggedized (Heavy Epoxy Glass Stem), S-Standardized (Rigid Plastic Stem) Thickness of standard probe appiles to 1/2" from tip only.

Note: The above listing is representative of our most widely used probes. Please consult us if your application requirements cannot be met by one of these probes.

Ask an Applications Expert about any of these products

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